Professor Jay Lee Speaks in the NIST Industry Forum on Monitoring, Diagnostics, and Prognostics for Manufacturing

Professor Jay Lee participated in the National Institute of Standards & Technology Industry Forum on Monitoring, Diagnostics & Prognostics, which was co-located with the ASME standards meeting. This event took place on May 8-10, 2018 and featured experts from industry and academia discussing relevant topics, such as technologies for prognostics and health management (PHM), international initiatives in PHM, and artificial intelligence applied in industry, among many others. This event included participants from Case Western University, General Motors, NASA, Penn State, TechSolve, University of Michigan and Yokogawa. Also in attendance was Dr. David Siegel, CTO at Predictronics Corp., a spin-off company from the IMS Center.

The goal of this event was to bring Industry, Government, and Academia together to discuss the current trends, successes, challenges, and needs with respect to advanced monitoring, diagnostic, and prognostic technologies to enhance maintenance and control strategies within manufacturing operations. Specifically, this event focused on current and emerging capabilities and challenges with respect to designing, deploying, verifying, and validating monitoring, diagnostic, and prognostic technologies for manufacturing operations including those involving interconnected, Internet of Things (IoT) technologies.

At this event, Professor Lee gave a talk on Industry AI - A system Perspective in Machine Learning for Smart Manufacturing and Maintenance, which focused on leveraging Artificial Intelligence to realize the rapid transformation from reactive, routine or condition based maintenance to "predict and prevent". Professor Lee also participated in a discussion panel titled Planning for the Future - Leveraging Artificial Intelligence. 

We encourage you to visit the event page here to learn more about this industry forum, as well as access all of the presentations given.  discover future NIST events in the areas of PHM, AI, IoT, etc.


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Professor Jay Lee
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